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Paul Scherrer Institut PSI Laboratory for Micro- and Nanotechnology



Updated:
06.09.2007
E-Mail: celestino.padeste@psi.ch


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Scanning Probe Microscopy (SPM) Service Lab

 
Lab for Micro- and Nanotechnology, PSI

Scanning Probe Microscopy has become an invaluable tool in the about 25 years since its discovery. A pool of two instruments, a Veeco Multimode and a Veeco Dimension are currently operated at PSI in order to support internal projects from LMN and all of PSI’s research departments as well as external projects.

Scanning Probe Microscopy is capable of mapping a variety of surface properties involving electric, magnetic fields in non-contact geometry as well as attractive and repulsive forces in proximity of the substrate. Beyond imaging, local experiments with individual atoms and molecules can be performed and local materials properties can be determined and modified. A wide range of research topics ranging from life sciences to material science, chemistry and physics as well as surface and interface science and the engineering of surfaces and nanostructures make beneficial use of one or the other SPM technique.

Surfaces and Interfaces in air, in liquids and at a variety of other conditions can be imaged and experimented with. For experiments on delicate, atomically clean systems in the ultra high vacuum the facility of the "Nanojunction Laboratory" is recommended which also provides the access to surface science techniques using photons, also at the Swiss Light Source.

Our Current Instruments

SPM nanocope multimode SPM Nanoscope DI 3100

Nanoscope Multimode, Scanhead mounted below an Optical Microscope 

Maximum scan-size: 130µm,
Maximum sample size: 12x12mm.

The instrument provides data on solid/air and solid/liquid interfaces in the following experimental modes:

- AFM  Tapping Mode and Phase Imaging
- AFM  Contact Mode
- MFM Magnetic Force Microscopy
- LFM   Lateral Force Microscopy
- CAFM Conductive AFM
- STM   Scanning Tunneling Microscopy

Examples

Nanoscope DI 3100 Scanning Station
mounted on a vibration isolation table

Maximum scan-size: 130µm
Maximum sample size: up to 6” Wafer

The instrument provides data on solid/air and solid/liquid interfaces in the following experimental modes:

- AFM  Tapping Mode, Phase Imaging
- AFM  Contact Mode
- LFM   Lateral Force Microscopy
- MFM  Magnetic Force Microscopy

"atomic resolution"
sampe: mica
image: 5nm x 5nm

emssion tips for the
low emittance gun project
image: 10um x 10 um
atomic steps on crystalline salt
collaboration: surface chemistry
image: 10um x 10 um

We can serve also:
Vibration (ICP) measurement (seismically)
0.5Hz to 2 kHz (0.3Hz to 4 kHz +/- 10%)
Amplitude Range 5g
Resolution 0.000005g


Sound or Noise measurement
With up to 2 microphones (locally calibrated)
20 Hz to 20 kHz
A/D Transducer 24bit-192 kHz
Dynamic range 110dB (A)

In interaction with project partners we have successfully designed and implemented apparatus for very complex experiments. Do not hesitate to make an appointment for a discussion if you can imagine some benefit from nano-scopic images and experiments of your samples.

User Support and Instrument Time Reservation: Scientific Advice and Analysis:
R. Schelldorfer T. Jung
++41 56 310 45 66 ++41 56 310 45 18
rolf.schelldorfer(at)psi.ch thomas.jung(at)psi.ch

All users of the SPM Userlab at PSI are requested to acknowledge the use of the PSI SPM Userlab. Consequent to  extended interaction periods and discussions leading to novel conclusions a specific personal acknowledgement and / or coauthorship is appropriate.